advanced-materials-nano-engineering-2018-posters

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Page 73
Volume 4
December 10-12, 2018
Rome, Italy
Nano Research & Applications
ISSN: 2471-9838
Advanced Materials 2018
Nano Engineering 2018
JOINT EVENT
22nd International Conference on
Advanced Materials
and Simulation
&
22 nd Edition of International Conference on
Nano Engineering &
Technology
Lately, scanning ion conductance microscopy (SICM) has
emerged as a versatile non-contact imaging tool. To obtain
spatially-resolved electrochemical information, scanning
electrochemical microscopy (SECM), also known as the chemical
microscope, has been developed. Hybrid SICM-SECM techniques
have been developed, in which the SICM compartment provides
the accurate probe-sample distance control, while the SECM
compartment measures the faradaic current for electrochemical
information collection. In this work, we demonstrate the use of
an atomic force microscopy (Park NX10) in combination with an
ammeter for concurrent topography imaging and electrochemical
mapping. The SICM-SECM probe consisted of an Au crescent
electrode (AuE) on the peripheral of a nanopipette. High resolution
probe-substrate distance control was obtained by the ion current
feedback from SICM, while simultaneous electrochemical signal
collection was achieved via the AuE from SECM. As a proof-of-
concept experiment, an Au/Pyrex pattern standard sample was
imaged with the SICM-SECM technique. The Au bar and the Pyrex
substrate were clearly resolved from the SICM topography image,
with the bar height and pitch width closely matching the actual
values. In terms of the electrochemical property mapping, higher
Faradaic current was seen when the probe was scanned over
Au bar as a result of redox cycling, while lower Faradaic current
was observed when the probe was over Pyrex substrate due to
hindered diffusion. The capability of the SICM-SECM technique
described here holds promise of many applications in the field of
electrochemistry, material science and nanoengineering.
Wenqing Shi, Gabriela Mendoza, Byong Kim and Keibock Lee
Park Systems Inc., Santa Clara, USA
Nano Res Appl 2018, Volume 4
DOI: 10.21767/2471-9838-C7-028
Simultaneous topographical and
electrochemical mapping using scanning
ion conductance microscopy – scanning
electrochemical microscopy (SICM-SECM)