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Nano Research & Applications
ISSN 2471-9838
Advanced Nano 2017
Notes:
Page 31
September 11-12, 2017 Amsterdam, Netherlands
20
th
International Conference on
Advanced Nanotechnology
Deformation rate dependence of atomic
force microscope based nano-mechanical
measurements
Samuel Lesko
1
, Bede Pittenger
2
, Jianli He
2
, Lin Huang
2
, Thomas
Mueller
2
and
Peter De Wolf
2
AFM Unit, Bruker, Santa Barbara, California, United States
T
he mechanical properties and extent of sub-micron
features in polymer blends and composites are of
interest due to their influence on macroscopic material
performance. Atomic force microscopy is a natural tool to
study thesematerials due to its high resolution and its ability
to directly probe the mechanical properties of the sample.
Over the past two decades, AFM based mechanical
property mapping techniques have evolved from slow
force volume to much faster dynamic measurements using
TappingMode and contact resonance. Recently, real-time
control of the peak force of the tip-sample interaction has
led to a fundamental change in AFM imaging, providing
force-volume-like quantitative mapping of mechanical
properties at reasonable scan rates and very high
resolution, even on soft materials. During material property
mapping, the time scale of tip-sample interaction now
spans from microseconds to seconds, tip sample forces
can be controlled from piconewtons to micronewtons,
and spatial resolution can reach sub-nanometer. This
has enabled AFM to become a unique mechanical
measurement tool having large dynamic range (1 kPa
to over 300 GPa in elastic modulus) with the flexibility
to integrate with other physical property characterization
techniques. In addition to elastic and plastic properties,
researchers have begun to take advantage of the wide
range of deformation rates accessible to AFM in order
to study time dependent properties of materials such
as viscoelasticity. More traditional measurements with
indentation DMA are usually limited in frequency to a few
100 Hz and have limited spatial resolution. In contrast,
AFM measurements can extend from less than 1 Hz
to kHz and beyond while retaining the high resolution
needed to see the details in distribution of properties
near domain boundaries in nanocomposites and thin
films. This presentation will review this recent progress,
providing examples that demonstrate the dynamic range
of the measurements, and the speed and resolution with
which they were obtained. Additionally, the effect of time
dependent material properties on the measurements will
be discussed.
Biography
Samuel LESKO is currently working as an Applications Manager at EMEA &
Latin America | Bruker Nano Surfaces Division
samuel.lesko@bruker.comSamuel Lesko et al., Nano Res Appl 2017, 3:3
DOI: 10.21767/2471-9838-C1-002