31 / 56
E u r o S c i C o n C o n f e r e n c e o n
Nanotechnology &
Smart Materials
Nano Research & Applications
ISSN 2471-9838
O c t o b e r 0 4 - 0 6 , 2 0 1 8
Am s t e r d a m , N e t h e r l a n d s
Nanotechnology & Smart Materials 2018
Page 55
W
e have developed a new AFM-based platform combining IR spectroscopy and acoustic and/or microwave 3D tomography to
detect and characterize lipidic vesicles present in the cytoplasm of various micro-organisms. We started with the bacteria
Streptomyces
that is able to store excess of carbon as triacylglycerols (TAGs) in lipid vesicles. TAG are a ready-to-use source of bio-
diesel, chemically and structurally identical to those found in commercial fuels. To illustrate the potential of these techniques, we will
present the detection and size distribution (accuracy under 10 nm) of triglycerides vesicles in
Streptomyces
using high-resolution
infrared microscopy AFM-IR as well as acoustic wave in ultrasound mode UA-AFM. We extended the excitation range to microwave
(range up to 16 GHz) and achieved a comparative study of AFM-IR, acoustic andmicrowave scanning analysis. Our results indicate that
the coupling of these techniques constitutes a great advantage to fully characterize chemical, topographical and volumetric parameters
of a biological sample. We will present a 3D reconstruction of bacteria or yeast cells, showing the in-depth vesicles distribution. Similar
analysis will be carried out with oleaginous (
Yarrovia lipolytica
) and non-oleaginous yeasts (
Saccharomyces cerevisiae
yeasts) as well
as with Listeria in order to demonstrate the great potential of acoustic and microwave microscopy.
Tomographic and chemical analysis of the
lipid vesicles inside bacteria for biofuel
production by a new multi-frequency
UA-AFM-IR platform
E Lesniewska
1
, M J Virolle
2
, E Aybeke
3
, A
Deniset-Besseau
3
, N Pocholle
1
, E Bourillot
1
and A Dazzi
3
1
ICB UMR CNRS 6303, University of Bourgogne, France
2
I2BC UMR 9198, Universite Paris-Sud, France
3
Universite Paris-Sud, France
E Lesniewska et al., Nano Res Appl Volume:4
DOI: 10.21767/2471-9838-C6-024
Fig 1
: MS-AFM-IR platform
Fig 2
: – From top to bottom: AFM-IR at 1740 cm- 1, UA-AFM at 640
kHz and AFM image (Range 10 µm)