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Nano Research & Applications
ISSN 2471-9838
E u r o S c i C o n C o n f e r e n c e o n
Nanotechnology &
Smart Materials
O c t o b e r 0 4 - 0 6 , 2 0 1 8
Am s t e r d a m , N e t h e r l a n d s
Nanotechnology & Smart Materials 2018
T
o improve the proliferation resistance in nuclear fuel recycling technology,
it is crucial to develop an elemental analysis method of molten salt
composition in real-time. However, the analytical performance is greatly
influenced by its moisture content in molten salt. While spent nuclear fuel
treatment processing has been produced for decades, this process conducts
experiments within a hot cell due to high heat emitting nuclides and a
radioactive environment. Therefore, many researchers have worked inside hot
cell as harsh environment for monitoring the process. This method is simple,
but a very dangerous activity due to the highly radioactive material inside.
Hence, in this study, the effects of moisture content variation on the properties
of the laser induced breakdown spectroscopy (LIBS) and its spectral signals
were investigated using the molten salt composition with different moisture
contents. The spectra of hydrogen intensity showed a higher peak position
with increasing moisture content according to the laser power increasing.
The work looked at using a pulsed Nd:YAG laser operating at a fundamental
wavelength of 1,064 nm in 50 mJ power. In order to artificially add an exact
amount of moisture to the KF-LiF-ZrF4 mixed composition, two vials were used
which are linked by tube. The vials were sealed with vacuum grease and high
strength adhesive
Biography
Seunghyun Kim has completed his PhD from Chungnam
National University in Korea and postdoctoral studies from
Virginia Commonwealth University in USA. Currently, he is
serving as the Senior Researcher of KORAD for spent nuclear
fuel management.
shkim@korad.or.krDetection of nuclear material with moisture content by using
LIBS technique
Seunghyun Kim
Korea Radioactive Waste Agency (KORAD), Republic of Korea
Seunghyun Kim, Nano Res Appl Volume:4
DOI: 10.21767/2471-9838-C6-025