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Laser Optics & Photonics and Atomic & Plasma Science 2018

J u l y 1 6 - 1 7 , 2 0 1 8

P r a g u e , C z e c h R e p u b l i c

Page 37

American Journal of Computer Science and Information Technology

ISSN: 2349-3917

E u r o S c i C o n J o i n t E v e n t o n

Laser Optics & Photonics and

Atomic & Plasma Science

Alev Kizilbulut et al., Am J Compt Sci Inform Technol 2018, Volume 6

DOI: 10.21767/2349-3917-C1-002

I

n recent years, Carbon (C) has attracted much attention for obtaining p type

GaAs and AlGaAs because of its low diffusion coefficient, ability to be doped

to high levels, absence of memory effect. Furthermore, it has widely used

for optical and electronical devices such as vertical cavity surface emitting

lasers (VCSELs), heterojunction bipolar transistors (HBTs) and edge emitting

laser diode structures. High doping concentration of around ~10

19

-10

20

cm

-3

is

required for ohmic contact layers. However, degradation of surfacemorphology

also occurs at high doping concentrations and some hillocks can be seen

the wafer surface. In this study, we have grown carbon p-GaAs staircase

structures by using vertical type MOCVD reactor at the growth pressure of

50 mbar for obtain high doping concentration with good surfaces. Arsine

(AsH

3

) and trimethylgallium (TMGa) were used as precursors for arsenic and

gallium, respectively. Carbon tetra bromide (CBr

4

) was used for p-type dopant

precursor. We have investigated the effect of growth temperature, V/III ratio,

CBr

4

flow to hole concentration of p-GaAs. Carrier concentration of p-GaAs

staircase samples was performed by ECV measurements.

Biography

Alev Kizilbulut is PhD student at Cumhuriyet University in Solid

State Physics. She is working at ERMAKSAN Optoelectronic

R&D Center as a researcher. Her interests are the growth with

MOCVD and structural, electrical and optical characterizations

of semiconductor devices.

alev.kizilbulu@ermaksan.com.tr

The role of growth temperature, V/III ratio and CBr4 flow on

carbon doped p-GaAs epilayers

Alev Kizilbulut

1, 2

, Mehmet ErkuS

1, 2

, Nizam Muzafferoglu

1

and

Sezai Elagoz

2

1

Optoelektronic Research and Application Center, ERMAKSAN, Turkey

2

Nanophotonic Research and Application Center, Cumhuriyet University, Turkey