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Volume 3, Issue 2
ISSN: 2470-9905
Crystallography 2017
October 16-17, 2017
2
nd
International Conference on
October 16-17, 2017 | Chicago, USA
Applied Crystallography
Structure of viruses from experimental data from an X-ray free electron laser
Dilano K Saldin
and
F Jamalidinan
University of Wisconsin-Milwaukee, USA
T
he X-ray Free Electron Later (XFEL) is a brand new machine capable of delivering X-ray to a sample some 10 billion times
brighter than a conventional source. The question is whether one can exploit the ultra-brightness of the source to enable structure
determination of identical randomly oriented particles delivered to the beam by means of a sample delivery system specifically
designed for this purpose. The particles will be delivered to the XFEL in a specially designed apparatus that delivers identical particles
in random orientation. The question is whether one can determine the structure of the particles from the collection of diffraction
patterns even though one does not know the precise orientation of the particle in each. We demonstrate a solution with experimental
data for the icosahedral virus PR772 from an XFEL. What we exploit is the fact that the angular correlations amongst the intensities
are independent of particle orientation. Consequently an average over all diffraction patterns of the angular correlation merely
increases the accuracy of the angular correlation measurement. We have developed a method of extracting the X-ray diffraction
volume from accurately determined angular correlations. An iterative phasing algorithm then recovers the electron density of the
viruses from the diffraction volume.
Biography
Dilano K Saldin is a Professor at the Physics Department of the University of Wisconsin-Milwaukee, where he started as a Surface Physicist, but has over the past 10 years
turned his attention to the problem of structure determination in the XFEL particularly of viruses.
dksaldin@uwm.eduDilano K Saldin et al., Struct Chem Crystallogr Commun, 3:2
DOI: 10.21767/2470-9905-C1-002