advanced-nanotechnology-materials-2018-posters

Volume 4

Nano Research & Applications

ISSN: 2471-9838

Page 92

JOINT EVENT

October 04-05, 2018 Moscow, Russia

Edition of International Conference on

International Conference on

Advanced Nanotechnology

Materials Technology and Manufacturing Innovations

Advanced Nanotechnology 2018

& Materials-Manufacturing 2018

October 04-05, 2018

Some modern ideas of circuit diagnostics theory in the nanotechnology age

Nikolay Kinsht

and

Natalia Petrunko

Russian Academy of Sciences, Russia

iniaturization of chips increases the problem of their diagnostics, and here it is necessary to be taken into account

a number of factors. Tendencies in reducing accessibility for electrical connections and increasing the number

of elements in the volume of the chip contradict each other. The problems intensify the need for additional theoretical

studies on circuit diagnostics. The circuit diagnosis in common case can be defined as identification of the unknown

element parameters by using test influences form current and voltage sources and by using acceptable current and voltage

measurements. The analytical description of the problem solving has an important value. Complex application of several

ideas permits to create a new line of circuit diagnostic models. These ideas are a conception of three different types of

nodes for connecting sources and measurements, a conception of two sets of circuit elements with known and unknown

parameters and idea of special matrix constructions. On the basis of this it was managed to create circuit diagnostic

models taking into consideration a number of practically important features of the diagnostic process. Some of them

are enumerated. Variations of external passive parameters, short circuits and breaks can be considered as test influences

on the circuit. Some of the unknown parameters subsets may correlate each other with (linear) known ratios and this

feature may be an important factor. It is managed to find some analytical solutions in theory of circuit diagnosis in the

frequency domain.

Nano Res Appl 2018, Volume 4

DOI: 10.21767/2471-9838-C5-021