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Nano Research & Applications
ISSN 2471-9838
Advanced Nano 2017
Notes:
Page 58
September 11-12, 2017 Amsterdam, Netherlands
20
th
International Conference on
Advanced Nanotechnology
Identification and estimation of nonlinearity
in nano metrology system resulting from
target velocity
Saeed Olyaee, Masood Sherafat
and
Reza Ebrahimpour
Shahid Rajaee Teacher Training University, Iran
I
n the present study, we investigate the structure of
Developed Three-Longitudinal Mode Heterodyne
Interferometer (DTLMI). Then, the output relations of each
part are obtained considering Polarizing Beam Splitter
(PBS) leakage. According to this computational study,
the identity of error in phase measurement is examined
through simulations. According to these investigations,
the error is as frequent changes around the real value and
its amplitude is proportional to the leakage of Polarizing
Beam Splitter (BPS). The results reveal that 2% leakage
causes 3.18 nm and 2.05 nm errors at high and low target
speeds, respectively. Target speed is also a determinant
factor in the generated error type, so that in the speeds
higher than a particular limit, 45 degree shift is seen in the
periodic error and the amount of error will be larger.
Biography
Saeed Olyaee received his BSc degree in Electrical Engineering from
University of Mazandaran, Babol, Iran, in 1997 and MSc and the PhD degrees
in Electrical Engineering specializing in Optoelectronics from Iran University of
Science and Technology (IUST), Tehran, Iran, in 1999 and 2007, respectively.
He has established the Nano-photonics and Optoelectronics Research
Laboratory, NORLab, in 2006 and currently, he is the Head of NORLab and
Dean of Electrical and Computer Engineering Faculty, Shahid Rajaee Teacher
Training University SRTTU), Tehran, Iran. He presented and published more
than 100 scientific conference and journal papers, book, and book chapters,
and currently, he is Technical Manager of Journal of Electrical and Computer
Engineering Innovations (JECEI) and member of scientific committee of
several national and international conferences. His main research interests
include “Nano-displacement measurement, optical instrumentation and
photonic crystal fibers”.
s_olyaee@srttu.eduSaeed Olyaee et al., Nano Res Appl 2017, 3:3
DOI: 10.21767/2471-9838-C1-003