ISSN : 2471-9838

Nano Research & Applications

September 11-12, 2017 Amsterdam, Netherlands

ScientificTracks Abstracts

Deformation rate dependence of atomic force microscope based nano-mechanical measurements

Nano Res Appl

DOI: 10.21767/2471-9838-C1-002

Samuel Lesko, Bede Pittenger, Jianli He, Lin Huang, Thomas Mueller and Peter De Wolf

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Electrical properties of single core-shell metal oxide nanowires

Nano Res Appl

DOI: 10.21767/2471-9838-C1-002

Florica C, Costas A, Kuncser A, Boni A G, Preda N and Enculescu I

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