Line x tester analysis of maize inbred lines for grain yield and yield related traits

A line x tester analysis involving 48 test-crosses generated by crossing 24 elite maize inbred lines with two testers and four standard checks was conducted for different agronomic traits during 2010 cropping season at Melkassa Agricultural Research Center. The objectives of the study were to estimate general and specific combining ability effects of the inbred lines and to evaluate the test cross performance of the hybrids for grain yield and yield related traits. The genotypes were evaluated in 6x9 alpha lattice design replicated twice. Analysis of variance indicated significant mean squares due to genotypes for grain yield, 1000 kernel weight, days to anthesis and silking ear and plant heights, number of ears per plant, number of rows per ear and number of kernels per row. There were significant mean square differences due to line GCA for all the traits analyzed while tester GCA was significant only for grain yield and ear height. Mean squares due to SCA were highly significant for grain yield, plant and ear heights, number of kernels per row, 1000 kernel weight and days to anthesis. Generally, mean squares due to GCA of lines, and testers and SCA of line x tester interactions were significant for grain yield and most yield related traits indicating the importance of both additive and non additive gene actions in controlling these traits.

Author(s): Shushay W. Abrha, Habtamu Z. Zeleke and Dagne W. Gissa

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